Optical fringe analysis

Details Optical fringe analysis Optical fringe analysis

1980-06-24

1982-09-21

Corbin, John K.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

250237G, 350 37, 350162SF, G01B 1100, G02B 532

Patent

active

043504434

ABSTRACT:
An apparatus for measuring in-plane surface displacement utilizing speckle diffraction interferometry. A double exposure specklegram is incrementally illuminated with a narrow laser beam. The diffraction pattern created upon passing through the specklegram strikes a mask having a variable transparency pattern covering a range of spatial frequencies. The correlation of the diffraction pattern and mask pattern projects through the mask and is optically integrated along lines of constant spatial frequency. The intensity of the luminous energy line created thereby represents the degree of correlation. The peak intensity, as measured by a calibrated linear detector array, corresponds to the spatial frequency of that point on the specklegram and the surface displacement between speckle recordings. Orientation of the displacement at each specklegram increment is obtained by using a dove prism to rotate diffraction pattern until a maximum spatial frequency is observed.

REFERENCES:
patent: 3563652 (1971-02-01), Powell et al.
Sieve et al., "In-Plane Motion Measurements with Fourier Lensless Holography", Applied Optics, vol. 19, No. 10, May 15, 1980, pp. 1570-1571.
Abramson, N., "The Holo-Diagram-10: A Practical Device for Simulating Fringe Patterns in Hologram Interferometry", App. Optics, vol. 10, No. 91, pp. 2155-2161, Sep. 1971.
Shaalan et al., "Multiple Beam Holographic Interferometry", Optics Acta, vol. 25, No. 11, pp. 1025-1034, 1978.

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