Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2008-01-29
2008-01-29
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S451000, C372S032000
Reexamination Certificate
active
07324208
ABSTRACT:
An optical frequency measurement apparatus of the present invention includes: a coarse light frequency measurer that computes coarse light frequency (Fw) of measured input light based on a reference wavelength that is a wavelength of reference light; a pulsed light source that generates pulsed light including a plurality of optical frequency components with different repetition frequency (fs1) based on reference frequency (Fs) that is frequency of the reference light; a first beat signal generating section that generates a first beat signal having a first difference frequency (fc) that is difference frequency between optical frequency of the pulsed light closest to optical frequency of the measured input light among the plurality of optical frequency components and the optical frequency of the measured input light; a frequency measurer that measures the first difference frequency (fc) of the first beat signal; and an arithmetic section that computes the fine light frequency (Fx) based on the coarse light frequency (Fw), the reference frequency (Fs), the repetition frequency (fs1), and the first difference frequency (fc).
REFERENCES:
patent: 4905244 (1990-02-01), Wyeth et al.
patent: 9-297065 (1997-11-01), None
patent: 2004-61126 (2004-02-01), None
International Search Report issued in International Application No. PCT/JP2004/017962 mailed on Jan. 11, 2005 and English translation thereof, 2 pages.
Advantest Corporation
Connolly Patrick
Osha & Liang LLP
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