Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1986-12-18
1989-08-15
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
356 5, 356 285, 356349, G01B 902
Patent
active
048568996
ABSTRACT:
An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator, wherein the local oscillator comprises an optical frequency synthesizer/sweeper or a marker signal attached tunable laser. The optical frequency analyzer can be modified to measure the incident light itself as the object of measurement or light emerging from the object of measurement can be the incident light.
REFERENCES:
patent: 4523847 (1985-06-01), Bjorklund et al.
patent: 4569588 (1986-02-01), Nishiwaki et al.
patent: 4666295 (1987-05-01), Duvall et al.
Akiyama Koji
Iwaoka Hideto
Ohte Akira
Kojima Moonray
McGraw Vincent P.
Turner S. A.
Yokogawa Electric Corporation
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