Optical flaw detection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

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Details

35016211, 356445, G01N 2100, G01N 2155

Patent

active

044653719

ABSTRACT:
An optical method and apparatus for nondestructively inspecting a specimen for evidence of surface flaws, for example, cracks granularity and/or roughness characteristics, which would be indicative of component expected lifetime before failure are disclosed.
The distribution pattern of coherent light scattered by a surface illuminated sample is obtained with a transform lens (for a two-dimensional pattern) or a transform-cylinder lens pair (for a one-dimensional pattern). The surface scattered light distribution is inherently different for flawed and unflawed samples. Spatial frequency signatures obtained from measurements of the scattered light diffraction patterns are used to distinguish flawed from unflawed specimens. Measurements are not restricted to planar surfaces; curved sample shapes can be employed with appropriate optical component adjustments.

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