Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Reexamination Certificate
2005-08-23
2005-08-23
Meeks, Timothy (Department: 1762)
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
C427S009000, C427S162000, C427S166000, C427S255700, C118S665000, C118S668000, C359S580000, C359S588000, C359S885000
Reexamination Certificate
active
06933001
ABSTRACT:
The optical thickness of a film formed on a substrate is controlled precisely to manufacture an optical filter having an accurate optical thickness. Time is counted during a film being formed on a substrate to note time points t with respect to a reference time set in advance. At least one of two optical characteristics of energy transmittance and energy reflectance when the film being formed on the substrate is irradiated with monitoring light is expressed by a function f(t) of the time points t based on a theoretical formula of the optical characteristic. The optical characteristic is measured by irradiating the film with the monitoring light at the time points t. A designed thickness achieving time at which the optical thickness of the film designed thickness is predicted. The film formation is stopped at the designed thickness achieving time, thereby obtaining the optical filter.
REFERENCES:
patent: 3637294 (1972-01-01), Berthold, III
patent: 4144837 (1979-03-01), Johnston
patent: 4311725 (1982-01-01), Holland
patent: 4527510 (1985-07-01), Arndt
patent: 5131752 (1992-07-01), Yu et al.
patent: 5151295 (1992-09-01), Kawahara et al.
patent: 5425964 (1995-06-01), Southwell et al.
patent: 5503707 (1996-04-01), Maung et al.
patent: 5661669 (1997-08-01), Mozumder et al.
patent: 6481369 (2002-11-01), Takahashi et al.
patent: 6490497 (2002-12-01), Mitsuhashi et al.
patent: 2003/0003605 (2003-01-01), Chen et al.
Hiroyuki Abe
Mimura Yu
Mizuno Kazuyou
Markham Wesley D.
Meeks Timothy
The Fukukawa Electric Company, Ltd.
LandOfFree
Optical filter and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical filter and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical filter and method of manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3485333