Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2005-01-04
2005-01-04
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
06839130
ABSTRACT:
An optical pulse λ0from a light source section10is incident upon an optical fiber1through an optical demultiplexer section20,and its return light is supplied to an optical/electrical processing section30as the light of a plurality of different wavelengths λ1to λn by the optical demultiplexer section20,and is respectively converted into electrical signals. Signals of the converted return light are respectively sampled and are averaged by respective processing circuits402to40nof a signal processing section40so as to be formed as desired measurement waveforms. In the measurement waveforms, which are the results, data for corresponding sampling points are expressed as measurement data at an identical distance in the optical fiber.
REFERENCES:
patent: 4893006 (1990-01-01), Wakai et al.
patent: 5129721 (1992-07-01), Sakamoto et al.
patent: 5453826 (1995-09-01), Sugimoto et al.
patent: 5557401 (1996-09-01), Maeda et al.
Araki Tetsuya
Hirata Katsumi
Ando Electric Co. Ltd.
Kyusyu Ando Electric Co., Ltd.
Nguyen Tu T.
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