Optical examination apparatus particularly useful as a Fizeau in

Details Optical examination apparatus particularly useful as a Fizeau in Optical examination apparatus particularly useful as a Fizeau in

1987-11-23

1989-08-08

Willis, Davis I.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356 73, 356371, G01B 902

Patent

active

048547085

ABSTRACT:
Optical examination apparatus is described including a basic setup comprising a point source of light, a first optical system forming a converging beam of light reflected from the examined object, and a second optical system located to receive the intercepted beam of reflected light, to collimate it, and to direct the collimated beam to a viewing device. The basic setup is capable of combined operation as a Fizeau interferometer, a schlieren device, and/or a moire deflectometer.

REFERENCES:
patent: 3815998 (1974-06-01), Tietze
Dukhopel, "Interference Methods and Instruments for Inspecting Optical Flats" Sov. J. Opt. Tech., vol. 38, No. 9, pp. 570-578, 9/71.
Krasovskii et al., "The Sensitivity Threshold of an Auto Collimation Television Shadowgraph" Sov. J. Opt. Tech., vol. 41, No. 9, pp. 406-409, 9/74.
Marchant et al., "A Large Interferometer for the Examination of Aircraft Camera Window" Opt. & Laser Tech., pp. 158-160, 8/77.

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