Optics: measuring and testing – Range or remote distance finding – With photodetection
Reexamination Certificate
2007-11-13
2007-11-13
Robinson, Mark A. (Department: 2872)
Optics: measuring and testing
Range or remote distance finding
With photodetection
Reexamination Certificate
active
10489030
ABSTRACT:
The invention concerns an optical element (1) with an optical axis (3), designed in particular for an exposure lens used in semiconductor lithography. Said optical element comprises at least an extension (2, 2′) in the direction of the optical axis (3). A device (11) enables to induce a two-wave or multiple wave deformation in said optical element (1). At least a system (12) mounted in the extension zone (2, 2′) is designed to apply a force in said extension (2, 2′).
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Gellrich Bernhard
Muenker Hartmut
Petasch Thomas
Carl Zeiss Smt Ag
Robinson Mark A.
Welsh & Katz Ltd.
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