Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2006-03-07
2006-03-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
07009701
ABSTRACT:
An optical element according to the invention constituted by a multilayer structure having a periodic structural portion as at least one region constituted by repetition of a predetermined period, wherein an end surface of the multilayer structure not parallel to layer surfaces of the multilayer structure is used as a light input surface whereas one or each of opposite surfaces of the multilayer structure parallel to the layer surfaces is used as a light output surface. There is an intermediate layer between a medium and a surface of the multilayer structure, the intermediate layer having a refractive index less than the refractive index of the medium. The periodic structural portion of the multilayer structure can be regarded as a one-dimensional photonic crystal. Refracted light from the one-dimensional photonic crystal has good directivity and the direction of the refracted light has strong dependence on wavelength. When this wavelength dependence property is used, a spectroscopic device or a polarized light separating device of high resolution can be achieved without increase in device size.
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Kittaka Shigeo
Nakazawa Tatsuhiro
Nara Masatoshi
Oya Kazuaki
Tsunetomo Keiji
Geisel Kara
Nippon Sheet Glass Co. Ltd.
Toatley , Jr. Gregory J.
Whitham Curtis & Christofferson, PC
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