Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1981-08-28
1984-06-12
Sikes, William L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356125, 356127, 356239, 364552, G01B 902
Patent
active
044538278
ABSTRACT:
An optical distortion analyzer system which is capable of automatically quantifying with a high degree of accuracy and repeatability the optical quality of transparencies such as windshields or windows. The analyzer system is made up of a platform adapted to support the transparency with two degrees of freedom. A probe beam of electromagnetic radiation emanating from, for example, a laser is passed through the transparency as the transparency is moved about a horizontal and vertical axis establishing a plurality of test points on the transparency. An analyzer unit receives the probe beam and therefrom establishes horizontal and vertical deviations in the transparency as well as determining the cylindrical and spherical lens power components and principal meridan angle of the transparency. A processor provides recognizable opthalmic parameters of the above characteristics of the transparency and correlates these parameters with the plurality of test points on the transparency.
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Erlich Jacob N.
Koren Matthew W.
Sikes William L.
Singer Donald J.
The United States of America as represented by the Secretary of
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