Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-06-18
1995-06-13
Limanek, Robert P.
Optics: measuring and testing
By polarized light examination
With light attenuation
356360, 356366, 356127, 359 19, G02B 530, G01B 1103
Patent
active
054248345
ABSTRACT:
An optical displacement sensor that has a light beam polariscope located on the light path of light reflected from a target surface, and means for detecting the focal point position and transverse position of the light beam from the polariscope. The focal point position corresponds to axial displacement at the target surface, and the transverse position corresponds to inclination of the target surface, so the effect of the inclination of the surface can be compensated for by using a transverse position detection signal to adjust the light beam polariscope.
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patent: 4656348 (1982-04-01), Ando
patent: 4844617 (1989-07-01), Kelderman et al.
patent: 5062715 (1991-01-01), Nakata et al.
patent: 5161040 (1992-11-01), Yokoyama et al.
patent: 5206868 (1973-04-01), Deacon
Akedo Jun
Okazaki Yuichi
Agency of Industrial Science & Technology, Ministry of Internati
Limanek Robert P.
Williams Alexander Oscar
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