Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-12-24
1999-05-18
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
2502061, 2502014, 2502016, 356 301, 356 401, 396 98, 396106, 396120, G01B11/14
Patent
active
059055766
ABSTRACT:
A laser diode 11 irradiates an object 3 with beam light modulated in an appropriate cycle. A position detection element 21 outputs a pair of position signals responsive to the position of a light reception spot and a processing section finds a distance to the object 3 based on the position signals. The processing section comprises a modulation control circuit 34 for irradiating the object 3 with beam light as many times as appropriate for performing distance measurement operation, then stopping the distance measurement operation and generating modulation control output indicating the operation stop, and upon reception of modulation control input indicating the operation start from the outside, again starting the distance measurement operation. Therefore, if the modulation control output of one of the two optical displacement measurement devices is directed to the modulation control input of the other, both the optical displacement measurement devices operate alternately, thus do not interfere with each other.
REFERENCES:
patent: 4855585 (1989-08-01), Nonaka
patent: 5137350 (1992-08-01), Misawa et al.
patent: 5614984 (1997-03-01), Seki et al.
patent: 5814808 (1998-09-01), Takada et al.
Matsuda Hiroshi
Nishikawa Takayuki
Takada Yuji
Matsushita Electric & Works Ltd.
Pham Hoa Q.
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