Optical displacement and contour measuring

Optics: measuring and testing – By polarized light examination – With light attenuation

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350294, 356394, G01B 1100, G01B 1114, G02B 510

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044115288

ABSTRACT:
Apparatus for optical measurement of the displacement and the obliquity of a test surface relative to an imaginary reference surface. An inwardly converging ring of light is projected onto a test surface. An optical system conveys an image of this ring to a photo diode array where its circumference is compared to an imaginary image of the ring projected onto an imaginary reference surface. This comparison yields the displacement of the test surface through 360.degree. of rotation, which is converted into the shape or contour of the test surface.

REFERENCES:
patent: 2759106 (1956-08-01), Wolter
patent: 3187185 (1965-06-01), Milnes
patent: 3199400 (1965-08-01), Zabinski
patent: 3519829 (1970-07-01), Pradel et al.
patent: 3770940 (1973-11-01), Harr
patent: 3889117 (1975-06-01), Shaw, Jr.
patent: 4102575 (1978-07-01), Lapornik et al.
patent: 4281931 (1981-08-01), Chikama
patent: 4305661 (1981-12-01), Pryor et al.
Buck, T. M., "A Silicon Diode Array for Image Sensing", Proc. Conf. on Semiconductor Nuclear-Particle Detectors & Circuits, Gatlinburg, Tenn., 1968, pp. 306-310.
Khoury, H. A., "Linear Photodiode Feedback Automatic Alignment System", IBM Tech. Disc. Bull., 3-1975, pp. 2887-2889.
Karizomenov et al., "Photoelectric Instrument for Automatic Measurement of Dimensions in Cutting", Meas. Tech., (USA), vol. 15 #1, 1-1972, pp. 47-50.
Shafer, D. R., "Laser Beam Expander-A New Design", Proc. Soc. Photo-Dpt. Instrum. Eng. (USA), SPIE vol. 190, LASL Optics Conf. 1979, pp. 15-20.

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