Dynamic information storage or retrieval – Condition indicating – monitoring – or testing – Including radiation storage or retrieval
Reexamination Certificate
2005-09-06
2005-09-06
Nguyen, Hoa T. (Department: 2652)
Dynamic information storage or retrieval
Condition indicating, monitoring, or testing
Including radiation storage or retrieval
C369S047140, C714S006130
Reexamination Certificate
active
06940796
ABSTRACT:
The optical disk device according to the present invention has a data reader which reads data of an optical disk, the disk being provided in advance with an alternate area that serves as a substitute for a defective data area when there is a defect in a data area. The disk is recorded in advance with list information consisting of a plurality of sets each of the sets comprising a position on the disk for the data area and an address of the alternate area. The optical disk also includes buffers for buffering a data area that is defective after correcting it, and a storage device for storing a new alternate list on which is recorded the correspondence relationship between the alternate area and its buffer destination.
REFERENCES:
patent: 4841498 (1989-06-01), Sugimura et al.
patent: 5732050 (1998-03-01), Horie
patent: 6205099 (2001-03-01), Sasaki et al.
patent: 1-245463 (1989-09-01), None
patent: 03-207053 (1991-09-01), None
patent: 6-325494 (1994-11-01), None
patent: 8-180598 (1996-07-01), None
patent: 10-275425 (1998-10-01), None
patent: 2000-21090 (2000-01-01), None
patent: 2000-298949 (2000-10-01), None
Agustin Peter Vincent
Hayes & Soloway P.C.
NEC Electronics Corporation
Nguyen Hoa T.
LandOfFree
Optical disk device using a new alternate list for defect... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical disk device using a new alternate list for defect..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical disk device using a new alternate list for defect... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3441315