Dynamic information storage or retrieval – Specific detail of information handling portion of system – Radiation beam modification of or by storage medium
Reexamination Certificate
2007-12-25
2007-12-25
Edun, Muhammad (Department: 2627)
Dynamic information storage or retrieval
Specific detail of information handling portion of system
Radiation beam modification of or by storage medium
C369S124010, C369S059110
Reexamination Certificate
active
11033959
ABSTRACT:
A ratio of an erase current and a peak current when starting recording is defined as K=iER/iPK (S1), and iER11 is set equal to K×iPK1, and an ideal value iER11of an erase current that should be increased according to a temperature change is determined (S2). A value obtained by subtracting a current iBT at a bottom level emission intensity when starting recording from a current at an erase level emission intensity after the temperature rises is defined as iER1. By measuring this iER1, an ideal value iER11of the erase current is subtracted from iER1, and the resultant current is defined as iBT11(S3). This iBT11is set as an adjustment value of the bottom current, and a value obtained by adding this adjustment value to a bottom current when starting recording is set as a bottom current after change.
REFERENCES:
patent: 2006/0280080 (2006-12-01), Hsu et al.
patent: 2007/0036056 (2007-02-01), Seo
patent: 2007/0036059 (2007-02-01), Masui et al.
patent: 2000030276 (2000-01-01), None
Akagi Toshiya
Ishibashi Eisuke
Shimizu Shinya
Wada Yasuhiro
Edun Muhammad
Matsushita Electric - Industrial Co., Ltd.
Stevens Davis Miller & Mosher LLP
LandOfFree
Optical disk device and emission current adjusting method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical disk device and emission current adjusting method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical disk device and emission current adjusting method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3847433