Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1981-11-23
1984-06-26
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
369 58, G01N 2188
Patent
active
044563752
ABSTRACT:
A method for measuring the size of dimple-type defects in an area of the surface of a flat piece of transparent material, such as an optical disc. A large beam of collimated light is provided and passed through the piece of material in a normal orientation with respect to the surface being inspected. A screen is placed in the path of the beam emerging from the disc and circular shadows generated by refraction are measured to determine the size of the defects which produces them.
REFERENCES:
patent: 3964830 (1976-06-01), Ikeda et al.
patent: 4153336 (1979-05-01), Minami et al.
patent: 4341469 (1982-07-01), Gardiner et al.
Gardiner Mark E.
Kuntz David W.
Clark Ronald J.
Dietert L. A.
Discovision Associates
McGraw Vincent P.
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