Optics: measuring and testing – Inspection of flaws or impurities
Patent
1999-05-21
2000-11-28
Pham, Hoa Q.
Optics: measuring and testing
Inspection of flaws or impurities
3562372, 2502015, 369 4432, G01N 2100
Patent
active
06154275&
ABSTRACT:
A system and method are provided that allow an optical media inspection device to detect defects on or in optical media despite the presence of gross deformations in the media that would otherwise interfere with the inspection process. A holding device holds the optical media near the center while it is rotated for inspection. A negative displacement prohibitor impedes any negative displacement of the optical media. A positive displacement inhibitor, i.e., air pressure exerted on the optical media, holds the optical media substantially flat while it is being inspected. A closed-loop feedback system may be used to control the amount of air pressure exerted against the optical media.
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Gensel Lewis R.
Mueller William R.
van Hoof Peter
Guiliano Joseph M.
Mohan Brajesh
Pham Hoa Q.
WEA Manufacturing Inc.
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