Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-06-22
1997-06-17
Font, Frank G.
Optics: measuring and testing
By particle light scattering
With photocell detection
356 285, 356351, 356358, 356349, G01B 902
Patent
active
056402392
ABSTRACT:
There is disclosed an optical device having an electrooptic crystal on which a light beam is to be incident, and electrodes for applying a predetermined voltage to the electrooptic crystal.
The electrooptic crystal is disposed in an optical system in which the angles of light rays in the light beam temporally or spatially change, and the electrodes are disposed, so that its voltage application direction is parallel to both the optic axis of the electrooptic crystal and the direction of polarization of the light beam incident on the electrooptic crystal, or is parallel to one of the optic axis and the direction of polarization and is perpendicular to the other.
REFERENCES:
patent: 4229073 (1980-10-01), Lofspeich
patent: 4343536 (1982-08-01), Watanabe et al.
Kadowaki Hidejiro
Takamiya Makoto
Canon Kabushiki Kaisha
Font Frank G.
Kim Robert
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