Optical device

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Reexamination Certificate

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C356S305000, C356S326000, C250S208100

Reexamination Certificate

active

06839135

ABSTRACT:
An optical device includes an imaging device for imaging an incident beam onto a focal surface, and a support element which includes at least one side having a shape corresponding to the focal surface, where the side is located on the focal surface. The invention also includes a sensor array in close contact with the side of the support element having the shape of the focal surface.

REFERENCES:
patent: 3532429 (1970-10-01), Hughes et al.
patent: 4259014 (1981-03-01), Talmi
patent: 4467361 (1984-08-01), Ohno et al.
patent: 4647202 (1987-03-01), Kimura et al.
patent: 4963504 (1990-10-01), Huang
patent: 5018856 (1991-05-01), Harnly et al.
patent: H1152 (1993-03-01), Korendyke
patent: 5323042 (1994-06-01), Matsumoto
patent: 5343289 (1994-08-01), Crawford et al.
patent: 5399502 (1995-03-01), Friend et al.
patent: 5412240 (1995-05-01), Inoue et al.
patent: 5424827 (1995-06-01), Horwitz et al.
patent: 5436723 (1995-07-01), Kunselman et al.
patent: 5493393 (1996-02-01), Beranek et al.
patent: 5510273 (1996-04-01), Quinn
patent: 5532175 (1996-07-01), Racanelli et al.
patent: 5543340 (1996-08-01), Lee
patent: 5543947 (1996-08-01), Mase et al.
patent: 5581092 (1996-12-01), Takemura
patent: 5583067 (1996-12-01), Sanchez
patent: 5585295 (1996-12-01), Wu
patent: 5594569 (1997-01-01), Konuma et al.
patent: 5637519 (1997-06-01), Tsai et al.
patent: 5686328 (1997-11-01), Zhang et al.
patent: 5745046 (1998-04-01), Itsumi et al.
patent: 5757444 (1998-05-01), Takemura
patent: 5767930 (1998-06-01), Kobayashi et al.
patent: 5841170 (1998-11-01), Adan et al.
patent: 5851861 (1998-12-01), Suzawa et al.
patent: 5852488 (1998-12-01), Takemura
patent: 5856870 (1999-01-01), Curtiss
patent: 5858867 (1999-01-01), Hsai et al.
patent: 5880777 (1999-03-01), Savoye et al.
patent: 5903249 (1999-05-01), Koyama et al.
patent: 5923961 (1999-07-01), Shibuya et al.
patent: 5963320 (1999-10-01), Brooks et al.
patent: 6005661 (1999-12-01), Machler
patent: 6153445 (2000-11-01), Yamazaki et al.
patent: 6166397 (2000-12-01), Yamazaki et al.
patent: 6166414 (2000-12-01), Miyazaki et al.
patent: 6198133 (2001-03-01), Yamazaki et al.
patent: 6211536 (2001-04-01), Zhang
patent: 6256090 (2001-07-01), Chen et al.
patent: 6259138 (2001-07-01), Ohtani et al.
patent: 6274400 (2001-08-01), Jen
patent: 6274887 (2001-08-01), Yamazaki et al.
patent: 6277679 (2001-08-01), Ohtani
patent: 6281552 (2001-08-01), Kawasaki et al.
patent: 6284577 (2001-09-01), Suzawa et al.
patent: 6303963 (2001-10-01), Ohtani et al.
patent: 6306694 (2001-10-01), Yamazaki et al.
patent: 6337731 (2002-01-01), Takemura
patent: 6346730 (2002-02-01), Kitakado et al.
patent: 6358766 (2002-03-01), Kasahara
patent: 6362507 (2002-03-01), Ogawa et al.
patent: 6365917 (2002-04-01), Yamazaki
patent: 6384808 (2002-05-01), Azami
patent: 6392628 (2002-05-01), Yamazaki et al.
patent: 6399988 (2002-06-01), Yamazaki
patent: 6407430 (2002-06-01), Ohtani et al.
patent: 6420200 (2002-07-01), Yamazaki et al.
patent: 6469317 (2002-10-01), Yamazaki et al.
patent: 3544512 (1987-06-01), None
patent: 19523140 (1997-01-01), None
patent: 29823791 (1999-12-01), None
patent: 0 451 968 (1991-10-01), None
patent: 0 803 911 (1997-10-01), None
patent: 04-369271 (1992-12-01), None
patent: 05-102483 (1993-04-01), None
patent: 06-037314 (1994-02-01), None
patent: 07-202210 (1995-08-01), None
patent: 08-051207 (1996-02-01), None
patent: 08-078329 (1996-03-01), None
patent: 08-110530 (1996-04-01), None
patent: 10-135468 (1998-05-01), None
patent: 10-135469 (1998-05-01), None
patent: 10-144929 (1998-05-01), None
patent: 10-247735 (1998-09-01), None
German Patent Office Search Results, Nov. 2000.
U.S. patent application Ser. No. 10/386,257 including specification, drawings, claims, and filing receipt; filed Mar. 11, 2003; Inventor: Hideto Ohnuma.
U.S. patent application Ser. No. 09/454,146 including specification, drawings, claims, and filing receipt; filed Dec. 3, 1999; Inventors: Shunpei Yamazaki, et al.
Yoshida et al., “A Full-Color Thresholdless Antiferroelectric LCD Exhibiting Wide Viewing Angle with Fast Response Time,” SID 97 Digest, pp. 841-844.
Hwang et al., “High Performance Submicron SOI/CMOS with an Elevated Source/Drain Structure,” Proceedings of the Annual SOS/SOI Technology Conference, IEEE, vol. 19, 1993, pp. 132-133.
Choi et al., “Gate-Overlapped Lightly Doped Drain Poly-Si Thin-Film Transistors for Large Area-AMLCD,” IEEE Transactions on Electron Devices, vol. 45, No. 6, Jun., 1998, pp. 1272-1279.
Tanaka, et al., “Ultrafast Operation of Vth-Adjused p+-n+Double-Gate SOI MOSFET'S,” IEEE Electron Device Letters, vol. 15 (Oct., 1994), No. 10, pp. 386-388.
Inui et al., “Thresholdless Antiferroelectricity in Liquid Crystals and its Application to Displays,” J. Mater Chem., 1996, 6(4), pp. 671-673.
Takada, et al., Proceedings of 46THSpring Meetings of the Society for Applied Physics of Japan, 28P-V-8, p. 1316.
Hwang et al., “Novel Polysilicon/TiN Stacked-Gate Structure for Fully-Depleted SOI/CMOS,” IEDM '92, pp. 345-348.
Yoshihara, Ekisho, vol. 3, No. 3, pp. 190-194.
Furue et al., “P-78: Characteristics and Driving Scheme of Polymer-Stabilized Monostable FLCD Exhibiting Fast Response Time and High Contrast Ratio with Gray-Scale Capability,” SID '98 DIGEST, pp. 782-785.
Hatano et al, “A Novel Self-Aligned Gate-Overlapped LDD Poly-Si TFT with High Reliability and Performance,” IEDM '97, pp. 523-526.

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