Optical detector for echelle spectrometer

Details Optical detector for echelle spectrometer Optical detector for echelle spectrometer

1995-06-07

1997-01-21

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

2502086, G01J 318, G01J 336

Patent

active

055964079

ABSTRACT:
A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two-dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.

REFERENCES:
patent: 4820048 (1989-04-01), Barnard
patent: 4940325 (1990-07-01), Becker-Ross et al.
patent: 5002390 (1991-03-01), Gerlacher et al.
patent: 5018856 (1991-05-01), Harnly et al.
patent: 5087123 (1992-02-01), Gerlacher et al.
Donald G. York et al., "Echelle Spectroscopy With A Charge-Coupled Device (CCD)," SPIE vol. 290 Solid State Imagers For Astronomy (1981), pp. 202-207.

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