Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1991-08-23
1992-11-24
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
359 86, 359 55, 73655, 73656, 356347, G01L 124
Patent
active
051667428
ABSTRACT:
An object is typically illuminated by laser light, and reflected light carrying a speckle pattern is amplified by an image intensifier. First and second speckle patterns representing the object before and after its deformation, respectively are written by double writing into a ferroelectric liquid crystal spatial light modulator (FLC-SLM). The double-written image is read out from the FLC-SLM, and converted by a Fourier transform optical system into an output optical image, i.e., Young's fringe. The output optical image is detected by a photoelectric converter, and analyzed by an image processing device to determine a deformation of the object.
REFERENCES:
patent: 4506550 (1985-03-01), Sandhu
patent: 4651567 (1987-03-01), Sandhu
patent: 4884875 (1989-12-01), Okumura
"Real-Time In-Plane Vibration Measurements By Speckle Interferometry With the Aid of Liquid Crystal Light Valve", Tamiki Takemori, et al., Optics Communications, vol. 32, No. 1, Jan. 1990, pp. 198-200.
"Spatial Light Modulator Using Ferroelectric Liquid Crystal", Seiji Fukushima, et al., pp.43-47.
"Measurement of Surface Displacement by Speckle Image Technique--Quasi Real-Time Measurement Utilizing a Liquid Crystal Display--", Eiji Okada, et al., The transactions of the Institute of Electronics, Information and Communication Engineers C-1, vol. J73-C-1 No. 3, pp. 128-133, Mar. 1990.
"Analyzing Method of Flow Using Liquid Crystal TV", Muneharu Ishikawa, et al., Image information (I), pp. 83-90, Jan. 1991.
Hara Tsutomu
Kobayashi Yuji
Mukohzaka Naohisa
Takemori Tamiki
Yoshida Narihiro
Hamamatsu Photonics K.K.
Kurtz, II Richard E.
Turner Samuel A.
LandOfFree
Optical deformation measuring apparatus by double-writing speckl does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical deformation measuring apparatus by double-writing speckl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical deformation measuring apparatus by double-writing speckl will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-925745