Optical debris analysis fixture

Details Optical debris analysis fixture Optical debris analysis fixture

2005-03-29

2005-03-29

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

For size of particles

C356S244000, C356S246000

Reexamination Certificate

active

06873411

ABSTRACT:
A fixture for imaging particles passing through a cell includes a plate having a plurality of aligned component pin openings and a plurality of mount holes. Several components are mounted to the plate including a camera mount, an illuminator assembly, and a lens support assembly. The camera mount assembly has a pair of registration pins receivable in a pair of plurality of component pin openings, and the camera mount has a pair of base holes alignable with a pair of mount holes for receiving fasteners to secure the camera mount assembly to the plate. The illuminator assembly has a pair of registration pins receivable in a pair of plurality of component pin openings which are in the form of slide slots, the illuminator assembly having a set of flange slots alignable with another pair of the mount holes for receiving fasteners to secure the illuminator assembly to the plate. A pair of nudgers are positioned on opposite sides of the illuminator assembly, wherein each nudger has a rail with a slide slot therethrough, and a head extending from the rail. Each head has an adjuster moveable with respect to the head. The nudger slide slots receiving fasteners to secure the nudger to the plate so that the adjusters can move the illuminator to a desired position prior to securement to the plate.

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Search Report UK Patent Office dated Sep. 9, 2002.

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