Optical coupling for testing integrated circuits

Details Optical coupling for testing integrated circuits Optical coupling for testing integrated circuits

2006-01-10

2006-01-10

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

C324S754120

Reexamination Certificate

active

06985219

ABSTRACT:
A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focussing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.

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Valdmanis, J., Advanced Electro-Optic Sampling Permits Non-Invasive Testing of IC Performance, Electronic Engineering, Morgan-Grampian Ltd., London, GB, vol. 61, No. 756, pp. 35, 36, 40, 42 (Feb. 1, 1989).

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