Optical coordinate measuring system with dual path reflecting me

Details Optical coordinate measuring system with dual path reflecting me Optical coordinate measuring system with dual path reflecting me

1985-03-21

1987-03-24

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356 1, H01J 314, H01J 516

Patent

active

046527494

ABSTRACT:
An arrangement for scanning the measurement field of view of an optical measurement system, in which one or more reflecting surfaces are placed within the optical path(s) of an optical measurement system. The reflecting surface is rotated and/or translated through a control unit which controls accurately the rotating and/or translating motion. Mathematical corrections are applied to determine the true measured coordinates. The view direction of the optical measurement system is diverted by the reflecting surface mounted on a precision mechanism for scanning the view in a controlled manner.

REFERENCES:
patent: 3928759 (1975-12-01), Sansone
patent: 4493990 (1985-01-01), Koszytorz

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