Optical contour detector and methods for making and using

Details Optical contour detector and methods for making and using Optical contour detector and methods for making and using

1992-08-06

1994-01-11

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

250561, 356 1, 356 28, G01B 1124, G01P 336

Patent

active

052786331

ABSTRACT:
An optical contour detector (11) having a source of electromagnetic radiation (12) aimed at a contoured surface is provided. A first detector (13) and a second detector (14) are positioned near the contoured surface for detecting electromagnetic radiation reflected from a first portion of the surface. Outputs of the first detector (13) and the second detector (14) are differentially amplified to produce an output signal indicting when a change in contour or discontinuity in the surface is illuminated by the source of electromagnetic radiation (12).

REFERENCES:
patent: 3636364 (1972-01-01), Stempler et al.
patent: 3671126 (1972-06-01), Erb
patent: 4092068 (1978-05-01), Lucas et al.
patent: 4567347 (1986-01-01), Ito et al.
patent: 4634879 (1987-01-01), Penney
patent: 4850712 (1989-07-01), Abshire

Affiliated with

Also associated with

Rating

Optical contour detector and methods for making and using does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical contour detector and methods for making and using, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical contour detector and methods for making and using will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1634656