Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1999-08-27
2000-12-12
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356372, 356 401, G01B 1114
Patent
active
061606200
ABSTRACT:
An optical sensor for use on an electronic component placement machine. A spindle tip on a placement head for the machine holds the electronic component to be placed on a printed circuit board by means of, for example, a vacuum. A spindle driver housing is mounted surrounding the spindle-spindle tip combination such that the spindle tip can move relative to the spindle driver housing vertically, due to bias mounting. A light beam from an optical emitter passes through an opening in the spindle driver housing to a first mirror mounted at 45.degree. on a first inside surface of the spindle driver housing. The light is reflected from the first mirror to a second mirror on a second inside surface of the spindle driver housing. The second mirror is also at 45.degree.. The light beam is then reflected from the second mirror through a second opening on the other side of the spindle driver housing to an optical receiver. When the assembly is moved to a downward position and the component comes in contact with the printed circuit board, the spindle tip stops its downward movement, but the bias mounting of the spindle tip results in the relative downward movement of the spindle driver housing relative to the spindle tip, thereby causing the top end of the spindle tip to alter the light beam between the two mirrors, and thus detect the placement of the component onto the printed circuit board.
REFERENCES:
patent: 4373805 (1983-02-01), Mallinson
Font Frank G.
Punnoose Roy M.
Universal Instruments Corporation
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