Optical characteristic measuring apparatus

Optics: measuring and testing – By light interference – Having polarization

Reexamination Certificate

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C356S485000

Reexamination Certificate

active

07609386

ABSTRACT:
An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to each other, and outputs the first and second input light; an interference section which inputs one branched light of the first and second input lights to a measuring object, makes output light from the measuring object interfere with other branched light of the first and second input lights, and outputs a plurality of interference lights; a plurality of light receiving sections which are respectively provided for the interference lights, receives the interference lights respectively, and outputs signals in accordance with optical powers of the interference lights respectively; and a low-pass filter for filtering the outputted signals.

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patent: 7538885 (2009-05-01), Hirata et al.
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Connie J. Chang-Hasnain; “Tunable VCSEL”;, IEEE Journal on Selected Topics in Quantum Electronics, vol. 6, No. 6, Nov./Dec. 2000; pp. 978-987.
D. Vakhshoori, et al.; “MEMs-Tunable Vertical-Cavity surface-Emitting Lasers”; Nortel Networks.

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