Optical characteristic measurement system

Details Optical characteristic measurement system Optical characteristic measurement system

1998-12-23

2000-08-15

Kim, Robert H.

Optics: measuring and testing

For optical fiber or waveguide inspection

359124, G01N 2100

Patent

active

061044776

ABSTRACT:
An optical characteristic measurement system which can measure optical characteristics of an optical device precisely and stably without being affected by the polarization-dependent loss of optical components in the optical characteristic measurement system. The optical characteristic measurement system includes a multi-wave optical source for generating a signal light of linear polarization having a plurality of wavelengths each different from each other, a polarization scrambler for scrambling the polarization direction of the signal light to be supplied to a device under test, and an average power measurement unit for measuring an average power of the signal light outputted from the device under test, for each of the wavelengths.

REFERENCES:
patent: 4923290 (1990-05-01), Brinkmeyer et al.
patent: 5896211 (1999-04-01), Watanabe
patent: 5970201 (1999-10-01), Anthony et al.

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