Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial
Patent
1988-10-25
1991-03-05
Hellner, Mark
Optics: measuring and testing
Angle measuring or angular axial alignment
Alignment of axes nominally coaxial
356400, G01B 1125
Patent
active
049972790
ABSTRACT:
An alignment fixture includes an optical bench 12 mounting a semiconductor laser 21, a monitor 23 of optical emission, a lens 27 focused for transmitting optical emission along an optical axis 43, a holder 26 mounting the lens 27, a pedestal 36 positioning a diaphragm 29 spaced for the lens 27, an optical fiber 45, a tube 49 surrounding the fiber 45 and joined to the fiber 45, a bushing 55 surrounding the tube 49 and joined to the optical bench 12, and a datum surface 16' on the bench 12 for aligning the lens 27 and the fiber 45 with the optical axis 43.
REFERENCES:
patent: 4003075 (1977-01-01), Yonezu et al.
patent: 4650276 (1987-03-01), Lanzisera et al.
patent: 4722587 (1988-02-01), Thorsten
patent: 4772123 (1988-09-01), Radner
Gordon Eugene I.
Nielsen Robert J.
Stafford John W.
AMP Incorporated
Hellner Mark
Kita Gerald K.
LandOfFree
Optical bench for a semiconductor laser and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical bench for a semiconductor laser and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical bench for a semiconductor laser and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-492986