Optical axis polarization type laser interferometer

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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C356S493000

Reexamination Certificate

active

07599070

ABSTRACT:
An optical axis polarization type laser interferometer including a reference sphere which forms a reference of measurement, a retro-reflecting means disposed at a measurement object, a laser interference measuring apparatus for outputting a measurement value corresponding to an increase or a decrease in the distance to and from the retro-reflecting means; and a two-axis turning mechanism for turning an emission beam of the corresponding laser interference measuring apparatus centering around the reference sphere, which measures, with the center coordinates of the reference sphere used as the reference, the distance to and from the retro-reflecting means where the optical axes of the emission beam from the laser interference measuring apparatus mounted on the two-axis turning mechanism and a return beam become parallel to each other, wherein the fixing portion of the first axis turning mechanism installed at the base part of the apparatus is disposed at the inner circumference thereof, the reference sphere is placed at the fixing portion thereof, and at the same time, the moving portion of the first axis turning mechanism is placed at the outer circumference of the fixing portion, and the second axis turning mechanism is mounted on the moving portion thereof. Therefore, complexities in mechanism design can be simplified to a large extent with respect to the first axis turning mechanism that composes the two-axis turning mechanism.

REFERENCES:
patent: 5681981 (1997-10-01), McMurtry
patent: 5757474 (1998-05-01), Sopori et al.
patent: 6226884 (2001-05-01), McMurtry
patent: 6563569 (2003-05-01), Osawa et al.
patent: 6870605 (2005-03-01), Osawa et al.
patent: 7174652 (2007-02-01), McMurtry
patent: 7388674 (2008-06-01), Yanaka et al.
patent: 7408650 (2008-08-01), Ueshima et al.
patent: 2002/0036764 (2002-03-01), Osawa et al.
patent: 2003/0179362 (2003-09-01), Osawa et al.
patent: 2007/0024861 (2007-02-01), Yanaka et al.
patent: 2008/0049211 (2008-02-01), Ueshima et al.
patent: 2008/0316497 (2008-12-01), Taketomi et al.
patent: 20 2004 007 647 (2004-08-01), None
patent: 0 919 830 (1999-06-01), None
patent: 06-190225 (1994-07-01), None

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