Optical axis adjustment apparatus and method for particle size d

Details Optical axis adjustment apparatus and method for particle size d Optical axis adjustment apparatus and method for particle size d

1997-01-08

2000-05-09

Kim, Robert H.

Optics: measuring and testing

For size of particles

By particle light scattering

356343, 356335, G01N 1502

Patent

active

060611316

ABSTRACT:
A light scattering particle size distribution measuring apparatus inches a light source for providing a beam of light to contact with a sample cell holding a specimen. A detector assembly includes a first set of detector assembly includes a first set of detector elements for receiving scattered and/or diffracted light from the sample cell and a second set of detector elements positioned between the first set of detector elements. A removable scattering and/or diffracting target member can be positioned on the optical axis to provide a predetermined scattered and/or diffraction pattern to the detector assembly whereby the second set of detector elements can measure the predetermined fraction pattern to enable a movement of one of the light source and the detector assembly to align them on an optical axis.

REFERENCES:
patent: 5007737 (1991-04-01), Hirlman et al.
patent: 5737078 (1998-04-01), Takarada et al.

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