Optical assembly to be mounted on a microscope for measuring...

Optics: measuring and testing – Motion stopping

Reexamination Certificate

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Reexamination Certificate

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07079227

ABSTRACT:
An optical assembly to be mounted on a microscope for measuring micro-structures is provided, which images a first object image (7) onto a second object image (8) lying above the optical assembly and in this way shifts the object image at a standardized interface for a camera (12), as well as the interface for the camera itself, upwards. The optical assembly permits a stroboscope lamp (6) to be coupled into the incident beam path of the microscope over a beam splitter (5) without requiring any structural modifications to the microscope. Instead, the optical assembly according to the invention is simply mounted on the C-mount of the microscope. The invention enables the use of stroboscope lamps in commercially available microscopes, which otherwise are not suitable for stroboscopic examinations.

REFERENCES:
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patent: 6181431 (2001-01-01), Siu
patent: 6404545 (2002-06-01), Ishiwata
patent: 6859282 (2005-02-01), Weber et al.
patent: 2002/0089740 (2002-07-01), Wetzel et al.
patent: 61-013233 (1986-01-01), None
patent: WO 00/33727 (2000-06-01), None
Smith, W.J., “Modern Optical Engineering The Design of Optical Systems” 1966, McGraw-Hill Book Company, New York, XP-002244415, pp. 212-213.
Q. S. Davis et al., “Using a Light Microscope to Measure Motions with Nanometer Accuracy”, Optical Engineering, vol. 37, 1998, pp. 1299-1304.
N. F. Smith et al., “Non-Destructive Resonant Frequency Measurements on MEMS Actuators”, Proc. of IEEE 01CH37167, 39thAnnual Internat'l Reliability Physics Symposium, Orlando, FL 2001, pp. 99-105.
Microscope Scanning Vibrometer MSV 300, Polytec Hardware Manual for Scanner Controller MSV-Z-040, Microscope Adapter OFV-074 and Scanner Unit OFV-073, Polytec GmbH, Waldbronn, Germany 2002.

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