Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1982-08-05
1985-05-14
McGraw, Vincent P.
Optics: measuring and testing
By polarized light examination
With polariscopes
2504581, 2504611, 356417, G01N 2164, G01J 404
Patent
active
045168563
ABSTRACT:
An improved optical system for a fluorescent polarization instrument including a low wattage, low intensity focused light source and a polarizer/liquid crystal combination in the excitation path focusing excitation light of alternate planes of perpendicular polarization onto a fluorescent liquid sample. Emitted light from the fluorescent sample is filtered, polarized and focused onto a photomultiplier for processing. A series of non-reflective baffles are placed around the sample to reduce reflections. Monitoring means monitor the excitation light and maintain a substantially constant intensity level focused on the sample. The low wattage, low intensity light source is provided by a 50 watt tungsten halogen projector lamp.
REFERENCES:
patent: 4115699 (1978-09-01), Mizuta et al.
patent: 4160914 (1979-07-01), Wynn
patent: 4203670 (1980-05-01), Bromberg
patent: 4269511 (1981-05-01), Erwin
patent: 4291230 (1981-09-01), Heiss
patent: 4293225 (1981-10-01), Wheaton et al.
patent: 4295199 (1981-10-01), Curry et al.
Abbott Laboratories
McGraw Vincent P.
Shelton Dennis K.
Wilcox James L.
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