Optical apparatus and methods for performing eye examinations

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C351S246000, C351S205000

Reexamination Certificate

active

07631970

ABSTRACT:
An eye examination system is presented that obtains several parameters of the eye. A system according to some embodiments of the present invention include a keratometry system, a low coherence reflectometry system, and a low coherence interferometry system co-coupled to the eye. In some embodiments, the low coherence interferometry system can provide interferometric tomography data. A processor can be coupled to receive data from the keratometry system, the low coherence reflectometry system, and the low coherence interferometry system and calculate at least one parameter of the eye from that data.

REFERENCES:
patent: 1377740 (1921-05-01), Uribe-Troncoso
patent: 3767307 (1973-10-01), Bowker
patent: 5202745 (1993-04-01), Sorin et al.
patent: 5321501 (1994-06-01), Swanson et al.
patent: 5371588 (1994-12-01), Davis et al.
patent: 5520679 (1996-05-01), Lin
patent: 5537162 (1996-07-01), Hellmuth et al.
patent: 5894531 (1999-04-01), Alcoz
patent: 6053613 (2000-04-01), Wei et al.
patent: 6252666 (2001-06-01), Mandella et al.
patent: 6325512 (2001-12-01), Wei
patent: 6385358 (2002-05-01), Everett et al.
patent: 6501551 (2002-12-01), Teamey et al.
patent: 6575573 (2003-06-01), Lal et al.
patent: 6822741 (2004-11-01), Aronkyto et al.
patent: 7046371 (2006-05-01), De Lega et al.
patent: 7102756 (2006-09-01), Izatt et al.
patent: 7280221 (2007-10-01), Wei
patent: 2003/0011745 (2003-01-01), Molebny et al.
patent: 2003/0028100 (2003-02-01), Tearney et al.
patent: 2005/0140982 (2005-06-01), Chen et al.
patent: 2005/0174578 (2005-08-01), Wei
patent: 2006/0058682 (2006-03-01), Miller et al.
patent: 198 57 001 (2000-06-01), None
patent: 0 697 611 (1996-02-01), None
patent: WO 00/28884 (2000-05-01), None
patent: WO 03/105678 (2003-12-01), None
Gregor F. Schmid, Axial and peripheral eye length measured with optical low coherance reflectometry, Journal of Biomedical Optics 8(4), 655-662 Oct. 2003.
International Search Report and Written Opinion from related PCT Application No. PCT/US2005/003871 filed Feb. 9, 2005.
Izatt, J. et al., “Micrometer-Scale Resolution Imaging of the Anterior Eye in Vivo With Optical Coherence Tomography,” Arch Ophthalmol (1994), vol. 112, pp. 1584-1589.
U.S. Appl. No. 11/055,900, filed Feb. 10, 2005.
Danielson, B.L. et al., “Guided-Wave Reflectometry with Micrometer Resolution,” Applied Optics (1987), vol. 26, No. 14, pp. 2836-2842.
Golubovic, B. et al., “Optical Frequency-Domain Reflectometry Using Rapid Wavelength Tuning of a Cr4+;Forsterite Laser,” Optical Society of America (1997), vol. 22, No. 22, pp. 1704-1706.
Halgis, W. et al., “Comparison of Immersion Ultrasound Biometry and Partial Coherence Interferometry for Introcular Lens Calculation According to Haigis,” Graefe's Arch Clin Exp Ophthalmol (2000) 238: 765-773.
Hamed et al., “A Comparative Analysis of Five Methods of Determining Comeal Refractive Power in Eyes that have Undergone Myopic Laser in Situ Keratomileusis,” American Academy of Ophthalmology (2000), vol. 109, No. 4, pp. 651-658.
Hee, M. et al., “Polarization-Sensitive Low-Coherence Reflectometer for Birefringence Characterization and Ranging,” Opitcal Society of America (1992), vol. 9, No. 6, pp. 903-908.
Hitzenberger, C.K et al., “Measurement of the Axial Eye Length and Retinal Thickness by Laser Doppler Interferometry (LDI),” Ophthalmic Technologies (1991), vol. 1423. pp. 46-50.
Huang, D. et al., “Opitcal Coherence Tomography,” Science (1991), vol. 254, pp. 1178-1181.
Kobayashi, M. et al., “Polarization-Independent Interferometric Optical-Time-Domain Reflectometer,” IEEE (1991), vol. 9, No. 5, 6 pages.
Park, H. et al., “High Resolution Optical Ranging System,” Applied Optics (1981), vol. 20. No. 14, pp. 2389-2394.
Preussner, P.R., “Ray Tracing for Intraocular Lens Calculation,” Elsvier Science Inc. (2001), vol. 28, pp. 1412-1419.
Radhakrishnam, S. et al., “Real-Time Optical Coherence Tomography of the Anterior Segment at 1310 nm,” American Medical Association (2001), vol. 119, pp. 1179-1185.
Rollins, A. et al., “Optimal Interferometer Designs for Optical Coherence Tomography,” Optical Society of America (1999), vol. 24, No. 21, pp. 1-3.
Sorin, W.V. et al., “Simultaneous Thickness and Group index Measurement Using Opitcal Low-Coherence Reflectometry,” IEEE (1992), vol. 4, No. 1, pp. 105-107.
Takada, K. et al., “New Measurement System for Fault Location in Optical Waveguide Devices Baded on an Interferometric Technique,” Applied Optics (1987), vol. 26, vol. 9, pp. 1603-1606.
Andrew M. Rollins and Joseph A. Izatt, “Optimal Interferometer Designs for Optical Coherence Tomography,” Optics Letters, vol. 24, No. 21, Nov. 1, 1999, pp. 1484-1486.
Michael R. Hee and David Huang, Eric A. Swanson, James G. Fujimoto, “Polarization-Sensitive Low-Coherence Reflectometer for Birefringence Characterization and Ranging,” Journal of the Optical Society of America B, vol. 9, No. 6, Jun. 1992, pp. 903-908.
Non-final Office Action dated Feb. 16, 2007, in U.S. Appl. No. 11/055,900.
Amendment and Response to Office Action filed May 3, 2007, in U.S. Appl. No. 11/055,900.
Notice of Allowance dated Jun. 1, 2007, in U.S. Appl. No. 11/055,900.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical apparatus and methods for performing eye examinations does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical apparatus and methods for performing eye examinations, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical apparatus and methods for performing eye examinations will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4116845

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.