Optics: measuring and testing – Contour plotting
Patent
1977-12-23
1981-05-05
Rosenberger, R. A.
Optics: measuring and testing
Contour plotting
350163, 356354, G01B 1124
Patent
active
042655340
ABSTRACT:
Optical measuring and testing apparatus incorporating a holographically recorded, single-frequency, optically thin, phase grating. When this phase grating is illuminated by a quasi-monochromatic spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source for a high contrast, stable, interference fringe pattern. In one embodiment, elements are repositioned to move the light source with respect to the grating thereby to alter the number of fringes in a given area. In another embodiment the grating moves in a plane that is orthogonal to an axis from the light source. This motion causes the fringe pattern to move past detecting means thereby to sense motion of the grating. In a third embodiment, a phase grating operates as a Fourier filter in a coherent optical processor which generates equal height contour lines from the information contained in two vertical stereo photographs.
REFERENCES:
patent: 3672744 (1972-06-01), Strope et al.
patent: 3738753 (1970-09-01), Huntley
patent: 3787117 (1974-01-01), Watkins
patent: 4025197 (1977-05-01), Thompson
patent: 4118124 (1978-10-01), Matsuda
Collier et al., Optical Holography, Academic Press, New York, .COPYRGT.1971, pp. 289-292.
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