Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2006-02-14
2006-02-14
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By polarized light examination
C356S367000, C356S368000, C250S225000, C359S245000, C359S483010
Reexamination Certificate
active
06999172
ABSTRACT:
An optical apparatus that measures a polarization dependent characteristic of a measured object includes a light source for emitting non-linearly polarized light in an extreme ultraviolet region or an X-ray region, and a rotary polarizer for reflecting the light emitted from the light source, the polarizer including a set of mirrors repeating three or more reflections and being arranged such that an optical axis of incident light and that of outgoing light are aligned with the same straight line.
REFERENCES:
patent: 3968376 (1976-07-01), Pierce et al.
patent: 5075893 (1991-12-01), Epstein et al.
patent: 5239365 (1993-08-01), Inoue
patent: 5617076 (1997-04-01), Stern
patent: 5627645 (1997-05-01), Imagawa et al.
patent: 5764363 (1998-06-01), Ooki et al.
patent: 5929995 (1999-07-01), Johs
patent: 6046811 (2000-04-01), Wolff et al.
patent: 6084675 (2000-07-01), Herzinger et al.
patent: 6137618 (2000-10-01), Herzinger
patent: 6141102 (2000-10-01), Johs et al.
patent: 6356578 (2002-03-01), Yin
patent: 6411370 (2002-06-01), Rajchel et al.
patent: 6768422 (2004-07-01), Schofield et al.
patent: 6795184 (2004-09-01), Herzinger et al.
patent: 07-094396 (1995-04-01), None
patent: 2001-264696 (2001-09-01), None
K. Jacobi et al., “Small rotating triple-reflection polariser for a uv discharge lamp”, Journal of Physics E: Scientific Instruments, vol. 11, No. 10, Oct. 1978, UK, pp. 982-983.
M. Suzuki et al., “Direct measurement of magnetic circular dichroism and Kerr rotation spectra in vacuum ultraviolet using four-mirror polarizer”, Review of Scientific Instruments, American Institute of Physics, New York, US, vol. 66, No. 2, Part 2, Feb. 1, 1995, pp. 1589-1591.
R. L. Johnson, et al., “Spectroscopic ellipsometry with synchrotron radiation”, Review of Scientific Instruments, American Institute of Physics, New York, US, vol. 60, No. 7, Part 2B, Jul. 1, 1989, pp. 2209-2212.
T. Koide et al., “Polarization characterization of circularly polarized vacuum-ultraviolet and soft-x-ray helical undulator radiation”, Review of Scientific Instruments, American Institute of Physics, New York, US, vol. 66, No. 2, Part 2, Feb. 1, 1995, pp. 1923-1925.
A copy of an European Search Report mailed Jan. 30, 2004, issued in a counterpart foreign application.
Kondo et al., “Development of an EUV Reflectometer using a laser-plasma X-ray source”, Proceedings, SPIE, vol. 4144, 2000, pp. 76-81.
Yamamoto et al., “Soft-x-ray polarization measurement with a laboratory reflectometer”, Proceedings, SPIE, vol. 1720, 1992, pp. 190-194.
Höchst et al., “Performance evaluation of a soft x-ray quadruple reflection circular polarizer”, Rev. Sci. Instrum., 66 (2), Feb. 1995, pp. 1598-1600.
Koide et al., “Polarization characterization of circularly polarized vacuum-ultraviolet and soft-x-ray helical undulator radiation”, Rev. Sci. Instrum., 66 (2), Feb. 1995, pp. 1923-1925.
Masaki Fumitaro
Miyake Akira
Canon Kabushiki Kaisha
Morgan & Finnegan , LLP
Nguyen Sang H.
Toatley , Jr. Gregory J.
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