Optical analyzing unit and optical analyzing device

Optics: measuring and testing – Of light reflection

Reexamination Certificate

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Reexamination Certificate

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07342663

ABSTRACT:
At both ends of a waveguide43having a plurality of cores51, light emitting elements47and light receiving elements49are disposed so as to face end faces of the cores51. A switch44is overlapped over the waveguide43. In the switch44, switching windows52each can be switched between a state where light propagating through the core51is passed and a state where the light is reflected are arranged in the vertical and horizontal directions, and the switching windows52are arranged along the top faces of the cores51. A test board45having a plurality of channels60in each of which a metallic thin film61is formed is disposed over the switch44, and receptors62are fixed on the metallic thin film61in the channels60. A specimen containing a specific ligand is passed in each of the channels60.

REFERENCES:
patent: 6432364 (2002-08-01), Negami et al.
patent: 6529277 (2003-03-01), Weitekamp
patent: 6956651 (2005-10-01), Lackritz et al.
patent: 9-033427 (1997-02-01), None
patent: 2000-131237 (2000-05-01), None
patent: 2001-255267 (2001-09-01), None
patent: 2002-162346 (2002-06-01), None
patent: 2003-065945 (2003-03-01), None
patent: 2003-287493 (2003-10-01), None
Patent Abstracts of Japan; Publication number: 2000-131237; date of publication: May 12, 2000 (2 pages).
Patent Abstracts of Japan; Publication number: 2001-255267; Date of publication: Sep. 21, 2001 (2 pages).
Patent Abstracts of Japan; Publication number: 2002-162346; Date of publication: Jun. 07, 2002 (2 pages).
International Search Report for PCT/JP2004/018315 dated Mar. 1, 2005 (2 pages).
Patent Abstracts of Japan 2002-162346 dated Jun. 7, 2002 (2 pages).
Patent Abstracts of Japan 2003-065945 dated Mar. 5, 2003 (2 pages).
Patent Abstracts of Japan 09-033427 dated Feb. 7, 1997 (2 pages).
Patent Abstracts of Japan 2003-287493 dated Oct. 10, 2003 (2 pages).

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