Optical analyzer and method for reducing relative intensity...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

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C356S491000, C356S004050

Reexamination Certificate

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06882428

ABSTRACT:
A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.

REFERENCES:
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patent: 6750973 (2004-06-01), Tan et al.
patent: 20020113972 (2002-08-01), Rosenfeldt et al.
patent: 20030112442 (2003-06-01), Baney et al.
patent: 20030174337 (2003-09-01), VanWiggeren
patent: 20030223073 (2003-12-01), VanWiggeren et al.
patent: 0280075 (1988-08-01), None
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patent: 1130814 (2001-05-01), None
patent: 1207377 (2001-11-01), None
Gregory D. VanWiggeren, Ali R. Motamedi, Bogdan Szafraniec, Rod S. Tucker and Douglas M. Baney, “Single-Scan Polarization-Resolved Heterodyne Optical Network Analyzer”, published in OFC 2002 Technical Digest, Session WK2.
Copy of the European Search Report Dated: Nov. 10, 2004.

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