Optics: measuring and testing – By dispersed light spectroscopy – For spectrographic investigation
Reexamination Certificate
2007-03-02
2009-11-24
Lauchman, Layla G (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
For spectrographic investigation
C356S300000, C356S307000, C356S417000, C356S318000, C356S039000
Reexamination Certificate
active
07623233
ABSTRACT:
Multivariate optical analysis systems employ multivariate optical elements and utilize multivariate optical computing methods to determine information about a product carried by light reflected from or transmitted through the product. One method of processing and monitoring the product includes introducing the product at an inspection point; illuminating the product with a spectral-specific light though an optic lens; directing the light that has passed through at least a section of the product through at least one multivariate optical element to produce a first signal, the directed light carrying information about the product; detecting the first signal at a first detector; deflecting a portion of the directed light to produce a second signal in a direction of a second detector, the second detector configured to detect the second signal; and determining at least one property of the product at a rate of about one section of the product per second to about five sections of the product per second based upon the detector outputs.
REFERENCES:
patent: 5090807 (1992-02-01), Tai
patent: 5737076 (1998-04-01), Glaus et al.
patent: 5945676 (1999-08-01), Khalil et al.
patent: 6198531 (2001-03-01), Myrick et al.
patent: 6430513 (2002-08-01), Wang et al.
patent: 6529276 (2003-03-01), Myrick
patent: 6600560 (2003-07-01), Mikkelsen et al.
patent: 6870629 (2005-03-01), Vogel et al.
patent: 7123844 (2006-10-01), Myrick
patent: 7138156 (2006-11-01), Myrick et al.
patent: 7245374 (2007-07-01), Hendriks
patent: 7399968 (2008-07-01), Lewis et al.
patent: 7405825 (2008-07-01), Schuurmans et al.
patent: 2006/0158734 (2006-07-01), Schuurmans et al.
patent: 2008/0309930 (2008-12-01), Rensen
patent: 2009/0015819 (2009-01-01), Van Beek et al.
patent: 2009/0097024 (2009-04-01), Blackburn et al.
patent: 2004057284 (2004-07-01), None
patent: 2005062986 (2005-07-01), None
patent: 2007061435 (2007-05-01), None
patent: 2007061436 (2007-05-01), None
patent: 2007061437 (2007-05-01), None
patent: 2007062202 (2007-05-01), None
patent: 2007062224 (2007-05-01), None
patent: 2007064578 (2007-06-01), None
patent: 2008002903 (2008-01-01), None
patent: PCT/US2008/058382 (2008-03-01), None
patent: 2008057912 (2008-05-01), None
patent: 2008057913 (2008-05-01), None
Blackburn John C.
Freese Robert P.
James Jonathan H.
Perkins David L.
Priore Ryan J.
Lauchman Layla G
Ometric Corporation
Turner Padget Graham & Laney P.A.
LandOfFree
Optical analysis systems and methods for dynamic, high-speed... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical analysis systems and methods for dynamic, high-speed..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical analysis systems and methods for dynamic, high-speed... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4107187