Optics: measuring and testing – Of light reflection – With diffusion
Reexamination Certificate
2005-02-08
2005-02-08
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Of light reflection
With diffusion
C356S394000, C356S398000, C382S103000
Reexamination Certificate
active
06853454
ABSTRACT:
A system for optical detection of kinetic samples. The system includes a dual set of detectors linked to a single processor. The time of signal integration is different for each detector, allowing one detector to have a higher sensitivity by integrating over a longer time period while the second detector using shorter integration periods is able to measure kinetic events.
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Alpha Innotech Corporation
Nguyen Sang H
Schneck David M.
Schneck Thomas
Schneck & Schneck
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