Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2008-07-29
2008-07-29
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C359S297000, C356S330000
Reexamination Certificate
active
07405825
ABSTRACT:
The optical analysis system (20) for determining an amplitude of a principal component of an optical signal comprises a multivariate optical element (10) for reflecting the optical signal and thereby weighing the optical signal by a spectral weighing function, and a detector (9, 9P,9N) for detecting the weighed optical signal. The optical analysis system (20) may further comprise a dispersive element (2) for spectrally dispersing the optical signal, the multivariate optical element being arranged to receive the dispersed optical signal. The blood analysis system (40) comprises the optical analysis system (20) according to the invention.
REFERENCES:
patent: 4701021 (1987-10-01), Le Pesant et al.
patent: 4790654 (1988-12-01), Clarke
patent: 5090807 (1992-02-01), Tai
patent: 5486485 (1996-01-01), Kim et al.
patent: 5504575 (1996-04-01), Stafford
patent: 5737076 (1998-04-01), Glaus et al.
patent: 5748308 (1998-05-01), Lindberg et al.
patent: 6128078 (2000-10-01), Fateley
patent: 6198531 (2001-03-01), Myrick et al.
patent: 6504943 (2003-01-01), Sweatt et al.
patent: 6859275 (2005-02-01), Fateley et al.
patent: 6967763 (2005-11-01), Fujii et al.
patent: 7123796 (2006-10-01), Steckl et al.
patent: 2002/0057431 (2002-05-01), Fateley et al.
patent: 2003/0161039 (2003-08-01), Fukano et al.
patent: 1 318 426 (2003-06-01), None
patent: 2000-356751 (2000-12-01), None
patent: WO 02/057759 (2002-07-01), None
Alt, P.M.; Single Crystal Silicon for High Resolution Displays; 1997; Proc. 17th Int. Display Res. Conf., pp. M-19-28.
Dudley, D., et al.; Emerging Digital Micromirror Device Applications; 2003; SPIE; 4985: 14-25.
Hayes, R.A., et al.; Video-speed electronic paper based on electrowetting; 2003; Nature; 25:383-385.
Sato, F., et al.; High Resolution and Bright LCD Projector with Reflective LCD Panels; 1997; SID Int'l Symposium; pp. 997-1000.
Shimizu, J.A.; Single panel reflective LCD projector; 1999; SPIE; 3634:197-206.
Bakker Levinus Pieter
Hendriks Bernardus Hendrikus Wilhelmus
Hendriks Robert Frans Maria
Rensen Wouter Harry Jacinth
Schuurmans Frank Jeroen Pieter
Giglio Bryan
Koninklijke Philiips Electronics N. V.
Toatley , Jr. Gregory J.
LandOfFree
Optical analysis system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical analysis system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical analysis system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2795124