Opthalmic measuring apparatus

Details Opthalmic measuring apparatus Opthalmic measuring apparatus

2007-05-29

2007-05-29

Mai, Huy (Department: 2873)

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Objective type

Reexamination Certificate

active

10683126

ABSTRACT:
An optical characteristic of an eye is obtained which can not be measured through a uniform adjustment because of a large difference in the distribution of a refractive index, or the like. An arithmetic part first selects an interlock mode, and performs an alignment adjustment. Next, the arithmetic part measures refraction, and interlocks and moves a first illumination optical system and a first light receiving optical system on the basis of the refraction. The arithmetic part obtains a density distribution of point images obtained from a first light receiving part, and judges whether a measurement can be made for each area on the basis of the density. The arithmetic part makes an adjustment so that an unmeasurable area becomes measurable, and creates a composite point image from plural signals obtained in a process of the adjustment. Further, the arithmetic part uses the composite point image to perform a Zernike analysis, obtains the optical characteristic and outputs it on a display part or the like.

REFERENCES:
patent: 5929970 (1999-07-01), Mihashi
patent: 2580215 (1996-11-01), None
patent: 2001-204690 (2000-10-01), None
patent: 2002-204784 (2002-07-01), None
patent: WO 01/47407 (2000-12-01), None

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