Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1994-04-26
1996-03-26
Sikes, William L.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351208, 351211, A61B 310, A61B 314
Patent
active
055025218
ABSTRACT:
An ophthalmometric apparatus comprising an eyeball observing device for observing the front part of the eyeball and a measuring unit moving device for moving a measuring unit relative to the eyeball, characterized by: a first optical index forming system that projects a light beam along the optical axis of the eyeball observing device to form a first alignment index in the eyeball; a first optical index detecting system that detects the position of the first alignment index on the basis of the light that travels along the optical axis of the eyeball observing device; a second optical index forming system that projects a light beam on the eyeball along an optical axis inclined at an angle to the optical axis of the eyeball observing device to form a second alignment index in the eyeball; a second optical index detecting system that detects the position of the second alignment index and has an optical axis in a substantially mirror image relation with the optical axis of the second optical index forming system with respect to the optical axis of the eyeball observing device; a correction calculating device that calculates distance information about the distance between the eyeball and the eyeball observing device represented by the output of the second optical index detecting system, on the basis of the output of the first optical index detecting system, and a display device that displays distance information provided by the correction calculating device and representing the distance between the eyeball and the eyeball observing device in the observation field of the eyeball observing device.
REFERENCES:
patent: 5101826 (1992-04-01), Katsuragi
Mai Huy
Nidek Co. Ltd.
Sikes William L.
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