Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1990-05-30
1993-02-02
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351221, A61B 310
Patent
active
051841576
ABSTRACT:
An ophthalmic measurement apparatus is provided in which a laser beam is converged at a selected point in a measurement zone within an eye and light scattered therefrom is photoelectrically detected via a measurement mask having an aperture of a prescribed size for ophthalmic measurement. During alignment the measurement zone is scanned at high speed by the laser beam with the same scanning width as the scanning width used during measurement. This makes it possible to observe any harmful light rays that will actually appear during measurement at those settings and to align the apparatus so that the harmful light rays do not come within the limiting aperture of the measurement mask, thereby enabling measurement to be conducted under optimum conditions.
REFERENCES:
patent: 4838679 (1989-06-01), Bille
Akiyama Koichi
Ichihashi Tadashi
Adams Bruce L.
Bovernick Rodney B.
Kowa Company Limited
Wilks Van C.
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