Ophthalmic apparatus

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

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Details

C351S200000

Reexamination Certificate

active

07354152

ABSTRACT:
An ophthalmic apparatus capable of checking the presence of abnormality such as soil on optical members and checking before examination whether or not the apparatus is in a state of being affected by disturbance light. The apparatus has a photo-receiving optical system, being arranged inside the apparatus and having optical members, for photo-receiving examination light reflected from the eye which is at an examination position outside the apparatus, a projection optical system, being arranged inside the apparatus and having a light source, for projecting detection light onto the optical member arranged nearest to the outside of the apparatus, a photodetector for photo-receiving reflected detection light when the light source is lit in a state where the eye is not placed at the examination position, and an abnormality detection device for detecting abnormality of the optical members based on an output signal from the photodetector.

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patent: 5237350 (1993-08-01), Sano
patent: 5309186 (1994-05-01), Mizuno
patent: 5469233 (1995-11-01), Katsuragi
patent: 5563667 (1996-10-01), Isogai et al.
patent: 5706072 (1998-01-01), Kawamura
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patent: 5767940 (1998-06-01), Hayashi et al.
patent: 6056404 (2000-05-01), Naoki et al.
patent: 6079828 (2000-06-01), Fujieda
patent: 6120149 (2000-09-01), Hosoi
patent: 6334682 (2002-01-01), Takai
patent: 61-185247 (1986-08-01), None
patent: 06-281726 (1994-10-01), None
patent: 7-39516 (1995-02-01), None
patent: 07-067840 (1995-03-01), None
patent: 07-124109 (1995-05-01), None
patent: 8-150116 (1996-06-01), None
patent: 2000-254098 (2000-09-01), None
patent: 2001-211449 (2001-08-01), None
EPO Search Report Apr. 21, 2004.
Partial EPO Search Report Jan. 22, 2004.
Office Action mailed on Dec. 7, 2006 (Japan).

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