Operation testing method, operation testing apparatus and...

Details Operation testing method, operation testing apparatus and... Operation testing method, operation testing apparatus and...

2007-01-16

2007-01-16

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

C702S119000, C702S122000, C702S123000, C702S127000, C702S182000, C702S188000

Reexamination Certificate

active

11208848

ABSTRACT:
A processing apparatus is caused to execute predetermined processing operation in a predetermined processing condition; a processing load factor in the apparatus is measured for when the predetermined processing operation is carried out in the apparatus; the measured load factor is compared with a predetermined target processing load factor range; the predetermined processing condition is adjusted in such a manner that the measured processing load factor may fall within the predetermined target processing load factor range; and operation verification of the apparatus is carried out in a condition where the measurement processing load factor falls within the target processing load factor. These steps are repeated while the target processing load factor range is changed in a predetermined manner.

REFERENCES:
patent: 5956662 (1999-09-01), Hemker et al.
patent: 8-255113 (1996-10-01), None
patent: 2001-236602 (2001-08-01), None

Affiliated with

Also associated with

Rating

Operation testing method, operation testing apparatus and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Operation testing method, operation testing apparatus and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Operation testing method, operation testing apparatus and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3821918