Operation speed measuring circuit and semiconductor device incor

Details Operation speed measuring circuit and semiconductor device incor Operation speed measuring circuit and semiconductor device incor

1995-09-01

2000-06-13

Ton, My-Trang Nu

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By frequency

327 99, H03D 300

Patent

active

060753897

ABSTRACT:
An operation speed measuring circuit measures a difference in propagation delay time between first and second path 2, 3 including logic gates connected in series and thus confirms that an element provided on a chip obtains a specified operation speed. This operation speed measuring circuit is so constructed as to be controllable by an input signal IN from one input terminal 1 and can be therefore disposed in such an area that the number of placeable terminals is restricted down to a small number. When this operation speed measuring circuit is provided with a power supply terminal independent of other circuits, constructions of other circuits can be independently designed. When the operation speed measuring circuit is disposed in the area independent of an intra-chip integrated circuit design area, a degree of freedom of designing other circuits is improved. This independent area is set in one of corner areas on the semiconductor chip that have hitherto been nothing but empty areas, the degree of freedom of designing the circuit is further improved.

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