Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-02
2007-10-02
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C713S300000
Reexamination Certificate
active
11173684
ABSTRACT:
In one embodiment, an integrated circuit comprises at least one measurement unit configured to generate an output indicative of a supply voltage at which the integrated circuit is operable for a given operating frequency and a control unit coupled to receive the output. The control unit is configured to generate a voltage control output indicative of a requested supply voltage for the integrated circuit responsive to the output. The voltage control output may be output from the integrated circuit for use by circuitry external to the integrated circuit in generating the supply voltage for the integrated circuit.
REFERENCES:
patent: 5440520 (1995-08-01), Schutz et al.
patent: 5682118 (1997-10-01), Kaenel et al.
patent: 5712589 (1998-01-01), Afek et al.
patent: 5856766 (1999-01-01), Gillig et al.
patent: 6078634 (2000-06-01), Bosshart
patent: 6154095 (2000-11-01), Shigemori et al.
patent: 6157247 (2000-12-01), Abdesselem et al.
patent: 6188252 (2001-02-01), Kawakami
patent: 6366157 (2002-04-01), Abdesselem et al.
patent: 6664775 (2003-12-01), Clark et al.
patent: 6762629 (2004-07-01), Tam et al.
patent: 6809606 (2004-10-01), Wong et al.
patent: 6874083 (2005-03-01), Sarangi et al.
patent: 6903964 (2005-06-01), Nahas et al.
Vincent Von Kaenel, et al., “A Voltage Reduction Technique for Battery-Operated Systems,” IEE Journal of Solid-State Circuits, vol. 25, No. 5, Oct. 1990, 5 pages.
Christopher Poirier, et al., “Power and Temperature Control on a 90nm Itanium-Family Processor,” 2005 IEEE International Solid-State Circuits Conference, 2 pages.
Tim Fischer, et al., A 90nm Variable-Frequency Clock System for a Power-Managed Itanium-Family Processor, 2005 IEEE International Solid-State Circuits Conference, 3 pages.
Tim Fischer, et al., “A 90nm Variable-Frequence Clock System for a Power Managed Itanium-Family Processor,” 2005 IEEE International Solid-State Circuits Conference, 2 pages.
Christopher Poirier, et al., “Power and Temperature Control on a 90nm Itanium-Family Processor,” 2005 IEEE International Solid-State Circuits Conference, 2 pages.
“CVD Circuit and Operation,” ISSCC 2005, Paper 16.2, ISSCC Visuals Supplement, p. 617.
“Impact of Double Switch Scheme,” ISSCC 2005, Paper 16.7, ISSCC Visuals Supplement, p. 623.
Dobberpuhl Daniel W.
Kaenel Vincent R. von
Merkel Lawrence J.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Nguyen Ha Tran
P.A. Semi, Inc.
Vazquez Arleen M.
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