Open probe method and device for sample introduction for...

Details Open probe method and device for sample introduction for... Open probe method and device for sample introduction for...

2011-04-19

2011-04-19

Vanore, David A (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

C250S281000, C250S282000, C095S082000, C095S087000, C095S089000, C096S101000, C096S102000, C096S104000

Reexamination Certificate

active

07928370

ABSTRACT:
An open probe method for sample introduction into a mass spectrometer is disclosed, comprising the steps of: loading a sample holder with sample compounds to be analyzed; heating a probe oven; introducing said sample compounds in said sample holder into said heated probe oven; flowing inert gas into said heated probe oven; vaporizing said sample in said heated probe oven by the combined effect of oven temperature and inert gas flow; entraining said vaporized sample in said inert gas; and, transferring said vaporized sample in inert gas into an ion source of a mass spectrometer; wherein said heated probe oven remains open to the ambient atmosphere during sample introduction and analysis; said inert gas is flowing in said heated probe oven in two directions of a transfer line to a mass spectrometer ion source and to the oven opening; said vaporized sample in inert gas is transferred through a heated transfer line directly into the ionization chamber of an ion source of a mass spectrometer. An apparatus for this method of sample introduction is also disclosed. The primary advantage of this method and apparatus is that the heated probe oven remains open to the ambient atmosphere during sample introduction and analysis thereby enabling faster sample analysis.

REFERENCES:
patent: 3976450 (1976-08-01), Marcote et al.
patent: 5686656 (1997-11-01), Amirav et al.
patent: 2001/0013579 (2001-08-01), Andrien et al.
patent: 2006/0255261 (2006-11-01), Whitehouse et al.

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