Open lead testing system for EEG

Details Open lead testing system for EEG Open lead testing system for EEG

1976-08-16

1981-02-03

Kamm, William E.

Surgery

Truss

Perineal

A61B 504

Patent

active

RE0305022

ABSTRACT:
A system for continuous monitoring for open circuits in multiple lead EEG systems during patient testing. Means are provided for repetitively applying a low current signal, having a distinctive waveform and frequency, to each electrode of the system. In the event an electrode is detached from the patient's scalp or otherwise open, the distinctive signal is apparent in the recorded output. Otherwise the distinctive signal is of such low magnitude that it is below the signal-to-noise ratio of the EEG amplifier. In systems including multiple leads, the test signal is successively applied to each electrode in the system in a time-controlled sequence. In one preferred embodiment a distinctive signal is used comprising a four pulse burst of 25 Hz frequency.

REFERENCES:
patent: 2262958 (1941-11-01), Offner
patent: 2933364 (1960-04-01), Campbell
patent: 3602215 (1971-08-01), Parnell
patent: 3621836 (1971-11-01), Nagatomi
patent: 3699432 (1972-10-01), Brown
patent: 3721230 (1973-03-01), Zievnicki
patent: 3732859 (1973-05-01), Tatano
patent: 3807387 (1974-04-01), MacNichol, Jr.

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